Deep inverse modeling the near field response of optical metasurfaces

  • Saad Lahrichi
  • , Ethan J. Mick
  • , Marshall B. Lindsay
  • , Scott D. Kovaleski
  • , Derek T. Anderson
  • , Jordan M. Malof
  • , Stanton R. Price
  • , Steven R. Price

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we investigate the problem of real-Time design of electromagnetic (EM) metamaterials to achieve custom scattering properties: A type of inverse modeling problem. To address this problem, we investigate a class of DNN-based models that are specially designed to address inverse problems, termed deep inverse models (DIMs). DIMs have recently shown tremendous promise for solving material design problems, however, relatively less work has been done for high-dimensional problems, such as near-field design. In this work, we performed 1500 simulations of a metasurface with a 3x3 array of meta-Atom pillars, where we independently and randomly-varied the radii of each pillar and recorded the resulting electric near-field values. We then used this dataset to train and evaluate several data-driven inverse models, including several variations of a recently-successful DIM, termed the Tandem. Our results indicate that the Tandem is capable of making relatively accurate design predictions in this challenging high-dimensional settings, and doing so in real-Time (e.g., roughly 4ms). We find that the choice of model architecture significantly impacts the accuracy of the inverse model, and even higher accuracy can be achieved with further improvements to the Tandem's design.

Original languageEnglish
Title of host publicationAdvanced Optics for Imaging Applications
Subtitle of host publicationUV through LWIR X
EditorsJay N. Vizgaitis, Peter L. Marasco, Jasbinder S. Sanghera
PublisherSPIE
ISBN (Electronic)9781510687219
DOIs
StatePublished - 2025
EventAdvanced Optics for Imaging Applications: UV through LWIR X 2025 - Orlando, United States
Duration: Apr 14 2025Apr 15 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13466
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvanced Optics for Imaging Applications: UV through LWIR X 2025
Country/TerritoryUnited States
CityOrlando
Period04/14/2504/15/25

Keywords

  • Deep learning
  • Inverse design
  • Metamaterials
  • Physics inspired neural networks

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