Single-photon multiple detachment in fullerene negative ions: Absolute ionization cross sections and the role of the extra electron

R. C. Bilodeau, N. D. Gibson, C. W. Walter, D. A. Esteves-Macaluso, S. Schippers, A. Müller, R. A. Phaneuf, A. Aguilar, M. Hoener, J. M. Rost, N. Berrah

Research output: Contribution to journalArticlepeer-review

Abstract

We have obtained experimental photo-double- and photo-triple-detachment cross sections for the fullerene negative ion using Advanced Light Source photons of 17-90 eV. The cross sections are 2 and 2.5 times larger than those for C60 and appear to be compressed and shifted in photon energy as compared to C60. Our analysis reveals that the additional electron in C60- primarily produces screening which is responsible for the modification of the spectrum. Both screening effects, the shift and the compression, can be quantitatively accounted for by a linear transformation of the energy axis. Applying the transformation allows us to map the neutral and negative ion cross sections onto each other, pointing out the close relationship of correlated few-electron dynamics in neutral and negatively charged extended systems. In contrast, dynamics of neutral and negatively charged atoms or small molecules are typically not closely related.

Original languageEnglish
Article number043003
JournalPhysical Review Letters
Volume111
Issue number4
DOIs
StatePublished - Jul 26 2013

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